Characterisation of nanodimensional structures using spectroscopic ellipsometry
نویسندگان
چکیده
منابع مشابه
Characterization of Nanocrystals Using Spectroscopic Ellipsometry
First applications of ellipsometry to the measurement of polyand nanocrystalline thin films date back to many decades. The most significant step towards the ellipsometric investigation of composite thin films was the realization of the first spectroscopic ellipsometers in the ’70s [3, 4, 8], which allowed the measurement of the dielectric function, the imaginary part of which is directly relate...
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R. Verre,1,2,* M. Modreanu,3 O. Ualibek,1 D. Fox,1 K. Fleischer,4 C. Smith,1 H. Zhang,1 M. Pemble,3 J. F. McGilp,4 and I. V. Shvets1,4 1Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College Dublin, Dublin 2, Ireland 2Department of Applied Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden 3Tyndall National Institute, Unive...
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ژورنال
عنوان ژورنال: Hemijska industrija
سال: 2009
ISSN: 0367-598X,2217-7426
DOI: 10.2298/hemind0903227m